Transactions on Advanced Research

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Luo, Yixin; Govindan, Sriram; Sharma, Bikash; Santaniello, Mark; Meza, Justin; Kansal, Aman; Liu, Jie; Khessib, Badriddine; Vaid, Kushagra; and Mutlu, Onur
Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance


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